Conference Description:
2012 3rd International Conference on Material and Manufacturing Technology (ICMMT 2012) will be held in Chengdu, China during May 5 - 6, 2012. The aim objective of ICMMT 2012 is to provide a platform for researchers, engineers, academicians as well as industrial professionals from all over the world to present their research results and development activities in Material and Manufacturing Technology. This conference provides opportunities for the delegates to exchange new ideas and application experiences face to face, to establish business or research relations and to find global partners for future collaboration. Submitted conference papers will be reviewed by technical committees of the Conference.
2012 3rd International Conference on Material and Manufacturing Technology (ICMMT 2012) is the premier forum for the presentation of new advances and research results in the fields of theoretical, experimental, and applied Material and Manufacturing Technology. The conference will bring together leading researchers, engineers and scientists in the domain of interest from around the world. Topics of interest for submission include, but are not limited to:
(01) Materials behavior
(02) Casting and solidification
(03) Powder metallurgy and ceramic forming
(04) Surface, subsurface, and interface phenomena
(05) Coatings and surface engineering
(06) Composite materials
(07) Materials forming
(08) Machining
(09) Nanomaterials and nanomanufacturing
(10) Biomedical manufacturing
(11) Environmentally sustainable manufacturing processes and systems
(12) Manufacturing process planning and scheduling
(13) Meso/micro manufacturing equipment and processes
(14) Modeling, analysis, and simulation of manufacturing processes
(15) Computer-aided design, manufacturing, and engineering
(16) Semiconductor materials manufacturing
(17) Laser based manufacturing
(18) Precision molding processes
(19) Joining processes
(20) Rapid manufacturing technologies
(21) Nontraditional manufacturing
(22) Nanofabrication, nanometrology and applications
(23) Metrology and measurement